Automated End-of-Line Tester Adds RFID Tagging

InvotecCase Study, Controls Engineering, Micro Laser Processing, Test Systems

automated end of line tester

How Invotec designed an automated end-of-line tester that helped one medical device manufacturer scale-up production while protecting IP The Challenge A large manufacturer of pathology solutions faced increased demands for their tissue-sampling probes. They forecasted volumes rising nearly 400% over the next five years—and they needed an additional, automated end-of-line tester to meet those goals. The company also wanted to add RFID tagging to protect their intellectual property as their products began to be sold internationally. The Solution Having designed … Read More

Invotec Engineering and Butterfield Engineering Working Together

InvotecControls Engineering, News

       Dayton, Ohio, USA, December 17, 2018–Invotec Engineering and Butterfield Engineering form a strategic agreement to provide customers robust software solutions for assembly and test equipment.    Invotec Engineering and Butterfield Engineering announced their plans for cooperation on December 17, 2018. Invotec provides custom automation equipment to medical device manufacturers for assembly, test, and inspection. As customers continue to face tighter regulations, Invotec recognized the need to integrate stronger software capabilities into their equipment for better data collection … Read More

Machine Vision and Part Forming

InvotecCase Study, Controls Engineering, Machine Vision Systems, Mechanical Assembly Systems

machine vision system

The Challenge Our customer was in need of a system to dynamically inspect and correct dimensional criteria on a precise metal component used in a medical device. Additionally, they needed a process that could automatically bend to form and modify the component until it was verified to be in compliance with the specifications. The Solution Invotec designed and built an inspection system that measures the profile of the component at two stations to capture dimensional data in dual planes. The … Read More